Elemental Analysis of
Forensic Material with
the National Aeronautics
and Space Administration
and the National Institute
of Justice X-ray Fluorescence
Detector
Tiffany
Fogg
tjfogg01@uncfsu.edu
Mentor:
Jacob I. Trombka
Laboratory
for Extraterrestrial
Physics, NASA Goddard
Space Flight Center
ABSTRACT
NASA, the National Aeronautics
and Space Administration
Goddard Space Flight
Center, in conjunction
with the National Institute
of Justice (NIJ) have
developed a break through
in technological advancement
for criminal justice
agencies and space science.
The portable yet non-destructive
innovation known as the
X-Ray Fluorescence, XRF,
conducts analysis on
samples collected from
local agencies. The XRF
method is primarily used
to measure the elemental
composition of materials.
It is the most favorable
alternative for field
applications and industrialized
production for control
because of its fast and
non-destructive design.
It is composed of an
x-ray tube and a voltage
multiplier that is attached
within a brass cylinder.
The target end is at
ground potential and
is to the left of the
tube. The current of
electrons in the tube
is generated from a photo
cathode at the right
of the tube. The tube
and voltage multiplier
circuit are isolated
from external surroundings
by a clear lead based
Plexiglas.
In XRF spectroscopy,
an atom can either absorb
the x-ray or it may be
scattered throughout
the material. Because
each element has a distinctive
set of energy levels,
these elements will generate
x-rays that are a unique
set of energies, allowing
scientist to non-destructively
determine the elemental
composition of a sample.
The process of emissions
of characteristic x-rays
is called X-ray Fluorescence.
The innermost valence
shells, which are the
K and L shells, are used
in XRF detection. An
x-ray spectrum from an
irradiated sample will
exhibit multiple peaks
of varied intensities.
During the analysis,
samples from a Gun Shot
Residue database, GSR,
provided significant
support in determining
minimal levels of antimony
(Sb), barium (Ba), copper
(Cu), lead (Pb), Tin
(Sn), Zinc (Zn) and Titanium
(Ti), all of which are
distinguishable elements
in the composition of
ammunition with the XRF
detector.
Paint is identifiable
through x-ray fluorescence
and is more finely tuned
to the physical and elemental
components. An analysis
of paint chips was used
to test the hypothesis
that the XRF detector
was used to provide significant
evidence in the crime
scene environment. In
addition, the x-ray fluorescence
demonstrated that the
paint chips provide vital
evidence of the elemental
composition of paint
on automobiles coherently.
The long-term goal was
to focus primarily on
the essential factors
of GSR and paint chips
on a non-destructive,
portable device that
will provide significant
support for the NASA
and the NIJ in determining
key aspects of a crime
scene.
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